Claim · model-written summary
At least four distinct large effect genes were represented among eight parents.
- Taxon
- Wheat
Triticum aestivumt0 - Gene
- genese0
- Outcome
- large‐effecte0
- Value
- foure0
Not reportedMaterialCompoundOrgan / stageInteractorInteractor roleSecond interactorSecond interactor roleTreatmentComparatorSettingDirectionQualifier
Organisms pictured · Representative pictures of the matched species, not figures from the paper.
Verbatim
e0“a minimum of four different large‐effect and three small‐effect genes for flag smut resistance were represented among the eight parents studied”
t0“Wheat”
Title
Flag Smut Reaction in Wheat: Its Genetic Control and Associations with Other Traits1
R. E. Allan Crop Science 1976. doi:10.2135/cropsci1976.0011183x001600050021x
Other claims from this paper (9)
- Association Segregation in five crosses suggested distinct large effect genes for flag smut resistance.
- Observation No completely susceptible lines were recovered, suggesting shared small effect resistance genes.
- Association Lowin appeared to have two large effect resistance genes different from those in three other parents.
- Association Ridit probably has one moderate resistance gene absent from three other parents.
- Association Segregation in two crosses involving CI 13749 suggested complementary resistance.
- Observation At least three small effect genes were represented among eight parents.
- Association Flag smut percentage was not associated with plant height, stripe rust reaction, maturity or spike type.
- Association Flag smut percentage was associated with chaff color in two of seven crosses.
- Association Flag smut percentage was associated with awn expression in one of five crosses.