Claim · model-written summary
Soil-applied silicon reduced the area under the spot blotch progress curve.
- Taxon
- wheat
Triticum aestivumt0 - Treatment
- Soil-applied silicont0
- Outcome
- area under the spot blotch disease progress curvee0
- Direction
- smallere0
Not reportedMaterialGeneCompoundOrgan / stageInteractorInteractor roleSecond interactorSecond interactor roleComparatorSettingValueQualifier
Organisms pictured · Representative pictures of the matched species, not figures from the paper.
Verbatim
e0“the area under the spot blotch disease progress curve and the leaf insertion angle in the plant were smaller”
t0“Soil-applied silicon decreases severity of wheat spot blotch on silicon-deficient soils”
t1“Soil-applied silicon decreases severity of wheat spot blotch on silicon-deficient soils”
Title
Soil-applied silicon decreases severity of wheat spot blotch on silicon-deficient soils
Luiz Antônio Zanão Júnior; Renildes Lúcio Ferreira Fontes; Paulo Henrique Moreira Coelho; et al. Revista Brasileira de Ciência do Solo 2010. doi:10.1590/s0100-06832010000200013
Other claims from this paper (7)
- Observation The two soils showed no significant difference in measured responses.
- Intervention effect Soil-applied silicon increased the wheat spot blotch incubation period.
- Intervention effect Soil-applied silicon increased wheat shoot dry matter yield.
- Intervention effect Soil-applied silicon increased leaf silicon content.
- Intervention effect Soil-applied silicon lowered final spot blotch severity.
- Intervention effect Soil-applied silicon reduced leaf insertion angle.
- Intervention effect Foliar silicon application produced responses similar to control plants.