Claim · model-written summary
Synthetic silicon reduced root cadmium concentration by 42.60%.
- Taxon
- wheat
Triticum aestivume1 - Treatment
- synthetic Si fertilizatione0
- Outcome
- Cd concentration in roote0
- Direction
- reducede0
- Value
- 42.60%e0
- Comparator
- control (Cd stress)e0
Not reportedMaterialGeneCompoundOrgan / stageInteractorInteractor roleSecond interactorSecond interactor roleSettingQualifier
Organisms pictured · Representative pictures of the matched species, not figures from the paper.
Verbatim
e0“synthetic Si fertilization was more effective than natural Si fertilization as it produced highest increase in plant height (21.40%), grain yield (25.21%), and reduced Cd concentration in root (42.60%) and shoot (59.71%) than control (Cd stress).”
e1“of wheat (Triticum aestivum L.)”
Title
Muhammad K. SOHAIL; Mukkram A. TAHIR; Zulfiqar A. SAQIB; et al. Notulae Botanicae Horti Agrobotanici Cluj-Napoca 2025. doi:10.15835/nbha53414874
Other claims from this paper (10)
- Intervention effect Both silicon sources significantly increased wheat growth and yield attributes.
- Intervention effect Cadmium stress significantly increased electrolyte leakage.
- Intervention effect Both silicon sources reduced oxidative stress.
- Intervention effect Both silicon sources raised superoxide dismutase and peroxidase activities.
- Intervention effect Silicon fertilization inhibited cadmium uptake by roots.
- Intervention effect Silicon fertilization inhibited cadmium translocation to shoots and grains.
- Intervention effect Synthetic silicon increased plant height by 21.40% over cadmium-stressed control.
- Intervention effect Synthetic silicon increased grain yield by 25.21% over cadmium-stressed control.
- Intervention effect Synthetic silicon reduced shoot cadmium concentration by 59.71%.
- Recommendation Authors prefer Ca silicate at 75 kg ha-1 for alleviating wheat cadmium impacts.